The circuitry may be rearranged for the purpose of the test to reduce the likelihood of solid state component damage while retaining the representative dielectric stress on the circuit 电路上某段出现尖峰电压时，为了测试，可以将电路重新安排，以减少固态组件受损的可能性。
2.
The circuitry may be rearranged for the purpose of the test to reduce the likelihood of solid state component damage while retaining the representative dielectric stress on the circuit 有获得的电介质应力集中在电路时，为了测试，可以将电路重新安排，以减少固态组件受损的可能性。
